VLSI Test Principles And Architectures: Design For Testability
| Use attributes for filter ! | |
| Google books | books.google.com |
|---|---|
| Authors | Laung-Terng Wang |
| Xiaoqing Wen | |
| Cheng-Wen Wu | |
| Copyright date | 2006 |
| Editors | Xiaoqing Wen |
| Genres | Thesis |
| Date of Reg. | |
| Date of Upd. | |
| ID | 1854728 |
About VLSI Test Principles And Architectures: Design For Testability
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. . . .