System-on-Chip Test Architectures: Nanometer Design For Testability
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| Google books | books.google.com |
|---|---|
| Originally published | 2008 |
| Genres | Thesis |
| Editors | Charles E. Stroud |
| Nur A. Touba | |
| Date of Reg. | |
| Date of Upd. | |
| ID | 1885716 |
About System-on-Chip Test Architectures: Nanometer Design For Testability
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. . . .
