Fundamentals Of Atomic Force Microscopy
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| Google books | books.google.com |
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| Originally published | January 12, 2015 |
| Authors | Reifenberger Ronald G |
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| ID | 1988373 |
About Fundamentals Of Atomic Force Microscopy
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. . . .